A Defective Ground Can Cause Electrical Overstress (EOS)

Ground connection loss or the presence of noise on the ground connection may cause a tool to accumulate voltage. When in contact with sensitive components, it can cause exposure to a current or voltage outside its operation range.

Why is EOS a Problem?

EOS can cause damage similar to ESD Events as they are both caused by unwanted electrical energy.

What is EOS?

Electrical overstress is a phenomenon where electrical signals applied to a circuit or a device exceed normal operating parameters.

How does it differ from ESD?

"An ESD Event could be compared with emptying a cup of water on a floor. There is a resulting small puddle, but once the content of a cup (i.e. charge) is gone, there is no more water coming and the damage from the spill is thus limited. An EOS event, however, could be compared with an open faucet. However little water it may drip in comparison with the sudden pour of water from the cup, with time this trickle may flood the entire floor and cause significant damage. The duration of typical EOS Events is several magnitudes longer than the duration of most ESD Events (microseconds or even milliseconds vs. nanoseconds) – thousand or even a million times longer; therefore this comparison “holds water.”

Kraz, Vladimir. “Electrical Overstress (EOS) and Its Effects on Today’s Manufacturing.” EE Web. EE Web, 19 January 2012. Web. 10 March 2016.

ESD

EOS

Additional Dangers of a Defective Ground

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